MIC284
Micrel, Inc
MIC284
4
September 2005
Symbol
Parameter
Condition
Min
Typ
Max Units
Serial Data I/O Pin (DATA)
V
OL
Low Output Voltage
I
OL
= 3mA
0.4
V
Note 6
I
OL
= 6mA
0.8
V
V
IL
Low Input Voltage
2.7V d V
DD
d 5.5V
0.3V
DD
V
V
IH
High Input Voltage
2.7V d V
DD
d 5.5V
0.7V
DD
V
C
IN
Input Capacitance
10
pF
I
LEAK
Input current
?.01
?
礎
Serial Clock Input (CLK)
V
IL
Low Input Voltage
2.7V d V
DD
d 5.5V
0.3V
DD
V
V
IH
High Input Voltage
2.7V d V
DD
d 5.5V
0.7V
DD
V
C
IN
Input Capacitance
10
pF
I
LEAK
Input current
?.01
?
礎
Status Output (/INT)
V
OL
Low Output Voltage,
I
OL
= 3mA
0.4
V
Note 6
I
OL
= 6mA
0.8
V
t
INT
Interrupt Propagation Delay,
from TEMP > T_SET or TEMPx < T_HYSTx
t
CONV
+1 ?/SPAN>s
Note 7, 8
to INT < V
OL
, FQ = 00, R
PULLUP
= 10k?/DIV>
t
nINT
Interrupt Reset Propagation Delay,
from any register read to /INT > V
OH
1
祍
Note 7
FQ = 00, R
PULLUP
= 10k?/DIV>
T_SET0
Default T_SET0 Value
t
POR
after V
DD
> V
POR
81
81
81
癈
T_HYST0
Default T_HYST0 Value
t
POR
after V
DD
> V
POR
76
76
76
癈
T_SET1
Default T_SET1 Value
t
POR
after V
DD
> V
POR
97
97
97
癈
T_HYST1
Default T_HYST1 Value
t
POR
after V
DD
> V
POR
92
92
92
癈
Over-Temperature Output (/CRIT)
V
OL
Low Output Voltage,
I
OL
= 3mA
0.4
V
Note 6
I
OL
= 6mA
0.8
V
t
CRIT
/CRIT Propagation Delay,
from TEMPx > T_SETx or TEMPx < T_HYSTx
t
CONV
+1 ?/SPAN>s
Note 7, 8
to INT < V
OL
, FQ = 00, R
PULLUP
= 10k?/DIV>
t
nCRIT
/CRIT Reset Propagation Delay,
from TEMPx < nCRITx to /CRIT > V
OH
1
祍
Note 7
FQ = 00, R
PULLUP
= 10k?/DIV>
CRIT1
Default CRIT1 Value
t
POR
after V
DD
> V
POR
97
97
97
癈
nCRIT1
Default nCRIT1 Value
t
POR
after V
DD
> V
POR
92
92
92
癈
Serial Interface Timing (Note 7)
t
1
CLK (Clock) Period
2.5
祍
t
2
Data In Setup Time to CLK High
100
ns
t
3
Data Out Stable After CLK Low
0
ns
t
4
DATA Low Setup Time to CLK Low
start condition
100
ns
t
5
DATA High Hold Time
stop condition
100
ns
After CLK High
Note 1. Exceeding the absolute maximum rating may damage the device.
Note 2. The device is not guaranteed to function outside its operating rating.
Note 3. Devices are ESD sensitive. Handling precautions recommended.
Human body model: 1.5k in series with 100pF. Machine model: 200pF, no series resistance.
Note 4. Final test on outgoing product is performed at T
A
= TBD癈.
Note 5. T
D
is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 6.
Note 6. Current into this pin will result in self-heating of the MIC284. Sink current should be minimized for best accuracy.
Note 7. Guaranteed by design over the operating temperature range. Not 100% production tested.
Note 8. t
CONV
= t
CONV0
+ t
CONV1
. t
CONV0
is the conversion time for the local zone; t
CONV1
is the conversion time for the remote zone.`
Note 9. Accuracy specication does not include quantization noise, which may be as great as ?/SPAN>
1
D2LSB (?.5癈).
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